While chipmakers enhance the functionality of semiconductor devices and increase multi-functionality, they need to reduce development times. The T2000 is ideal for testing these devices. Time to Market Reduction - Multi-Session The T2000 makes it possible to develop device test programs efficiently with minimal investment. With the multi-site CPU architecture unique to the T2000, multiple users can log in to a single test system at the same time, and perform debugging work independently. Up to eight people can work at the same time, contributing to both engineering cost savings and TTM reduction.

In addition, eight people can develop separate functions for the same device at the same time, greatly shortening development times. Best-In-Class Parallel Test Efficiency - Multi-Site Controller As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase, and in general test times tend to be longer. However, the T2000 reduces test time and achieves high throughput with highly efficient multi-site test technology which completely eliminates overhead. Test Time Reduction - Concurrent Test The T2000 supports concurrent test functionality which can execute complicated device test in shorter times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly switch between sequential execution and parallel execution of multiple test items. In addition, its concurrent test functionality enables users to rapidly develop test programs with short test times. Test Cost Reduction With up to 8,192 digital channels, the T2000 achieves more than twice the parallelism of the previous model, reducing test cost.

High-performance, high-throughput tester for mixed-signal devices used in applications ranging from automotive ASSP/ASIC, Analog Power ICs that power management semiconductors (PMICs) for high-volume consumer electronics, communication products and industrial usage. CMOS Image Sensor Test Solution The T2000 CMOS Image Sensor Test Solution is a single solution for evaluation and production testing of advanced CMOS image sensors with high-speed interfaces. This highly parallel system provides users with one of the industry’s lowest cost of test Flexible support for multifunction image sensors CMOS image sensors are now incorporating functions such as AD/DA and other SoC circuits. With its modular architecture, the T2000 can achieve the optimal configuration to test these complex devices while delivering low cost of test. Easy Subtitles Synchronizer 1.0 on this page.